Aerospace Science & Technology "vacuum material gas release rate test device" commercial

[China Instrument Network Instrument R&D] A few days ago, the "Vacuum Material Gas Release Rate Test Device" developed by China National Aerospace Science and Technology Corporation No. 514 Research Institute was successfully commercialized, and the test results generated by it were also confirmed by related test users.

According to reports, in the field of materials, "micro-gassing rate test technology" has very important significance for the evaluation and selection of vacuum materials. However, in practical tests, vacuum gas micro gas rate test often requires large area samples to be tested. For example, if a special material with a small gas-releasing rate is measured using a stainless steel container with an original volume of 10 liters, the surface area of ​​the sample is required to be at least 100 square meters or more. This requirement is not realistic in actual measurement, and it also brings great inconvenience to customers who submitted the test. Especially for some rare materials, it is basically impossible to obtain such a large number of samples.

In response to the limitations of the existing testing technologies, the 514 Vacuum Division of the 5th Aerospace Science and Technology Institute organized R&D personnel to develop a new vacuum material gassing rate testing device. The biggest feature of the device is the minimum requirement for the surface area of ​​the sample to be measured, reaching only about 5 Square centimeters, and this also successfully solves the test technology difficulty of the material deflation rate under vacuum conditions for special rare materials.

According to reports, before this, the "vacuum material gassing rate test device" has provided testing services for more than 30 military industrial units and scientific research institutions, completed the testing of gas release rate for more than 100 kinds of special materials, and selected vacuum materials for these units. And the correct estimation of device lifetime provides key data and analysis methods, and also lays the foundation for the device to commercialize.

(Original title: Aerospace Science and Technology Development Test Equipment to Solve Rare Material Testing Problems)

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